OBSERVE BEYOND

THE ORDINARY

TeraNova provides non-destructive solutions for critical dimension (CD) metrology and semiconductor characterizations using optical scatterometry and terahertz radiations. These solutions provide crucial information about the quality of the nanostructures and wafers used in photonics, semiconductors, and quantum applications.

Products and Services

Critical Dimension Metrology

for

Gratings and Thin Films

Our patented technology enables us to inspect the quality of gratings and thin films used in photonics, semiconductors, and quantum technologies. We determine modifications of geometrical parameters during the fabrication in a contact-free and non-destructive manner.

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Terahertz Near Field

for

Semiconductor Characterization

Our unique instrument allows investigation of the transient photo-conductivity and the carrier life-time of photo-excited semiconductors, providing a vast amount of data that is ideal for semiconductor characterization and quality inspection.

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